Conducted Immunity Standards for Commercial Electronic Products

This web site is being maintained by John R. Barnes, who was the President and Chief Engineer of dBi Corporation from 2002 to September 30, 2013, when we closed because ObamaCrap made it too expensive for us to remain in business.

John R. Barnes KS4GL, PE, NCE, NCT, ESDC Eng, ESDC Tech, PSE, Master EMC Design Engineer, SM IEEE
December 3, 2011
jrbarnes@iglou.com

Conducted Immunity tests check the behavior of products when exposed to amplitude-modulated radio-frequency noise on: This noise can be picked up from nearby radio transmitters by the equipment wiring and the installation wiring. Because the transmitters may operate continuously, immunity standards require the product to meet Performance Criterion A. I.e., it must operate normally, without any user intervention.

The table below summarizes the evolution of Conducted Immunity standards for commercial electronic products. Medical electronics and military electronics may have their own special requirements. The links take you to summaries of the standards and their amendments. "(Modified)" means that the standard/ amendment differs from the reference standard/ amendment. Entries in bold text are currently active for undated references. Please note that in Australia and New Zealand, products only need to comply with safety and emission standards to bear the C-Tick mark.

Evolution of Conducted Immunity Standards for Commercial Electronic Products
Year Reference Year European Union Year Australia & New Zealand Notes
1993 IEC 801-6:1993          
    1994 ENV 50141:1994      
1996 IEC 1000-4-6:1996 Edition 1 1996 EN 61000-4-6:1996      
1997 IEC 61000-4-6:1996 Edition 1   EN 61000-4-6:1996      
2000 IEC 61000-4-6:1996 +A1:2000

IEC 61000-4-6:2001 Edition 1.1

          
2003 IEC 61000-4-6:2003 Edition 2          
2004 IEC 61000-4-6:2003 +A1:2004

IEC 61000-4-6:2004 Edition 2.1

     2006 AS/NZS 61000.4.6:2006  
2006 IEC 61000-4-6:2003 +A1:2004+A2:2006 2007 EN 61000-4-6:2007 (may use until 1 MAR 2012      
2008 IEC 61000-4-6:2008 Edition 3 2009 EN 61000-4-6:2009      


AS/NZS 61000.4.6:2006 Electromagnetic compatibility (EMC) Part 4.6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

Equivalent to: IEC 61000-4-6:2003+A1:2004 & IEC 61000-4-6:2004 Edition 2.1
Replaces: AS/NZS 61000.4.6:1999
Replaced by:

For: Australia & New Zealand
Ratified/printed: 1 JUN 2006
May use starting: 1 JUN 2006
Must use starting: 1 JUN 2008
Must use until:
May use until:

References:
* IEC 60050(161)

Referenced by:
* AS/NZS 61000.4.3:2006 (undated)
* AS/NZS 61000.6.1:2006 (undated)
* AS/NZS 61000.6.2:2006 (undated)
* AS/NZS CISPR 22:2002 (undated)
* AS/NZS CISPR 22:2006 (undated)
* AS/NZS CISPR 22:2009 (undated)

Comments:

(hardcopy & E:\dbi\AS_NZS+61000.4.6-2006.pdf)


EN 61000-4-6:1996 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 6: Immunity to conducted disturbances induced by radio- frequency fields

Equivalent to: IEC 1000-4-6:1996 Edition 1 & IEC 61000-4-6:1996 Edition 1
Replaces:
Replaced by: EN 61000-4-6:1996+A1:2000

For: European Union
Ratified/printed: 2 JUL 1996
May use starting: 29 JUL 1996
Must use starting: 1 APR 2001
Must use until: 19 FEB 2001
May use until: 1 DEC 2003

References:
* CISPR 16-1:1993
* CISPR 20:1990
* IEC 50(131):1978
* IEC 50(161):1990
* IEC 1000-4-3:1995

Referenced by:
* EN 50082-1:1997 (undated)
* EN 55014-2:1997
* EN 55022:1998
* EN 55024:1998
* EN 55024:2010
* EN 61000-4-3:1996
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:1999
* EN 61000-6-2:2001 (undated)

Comments:

(hardcopy)


EN 61000-4-6:1996+A1:2000 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 6: Immunity to conducted disturbances, induced by radio-frequency fields

Equivalent to: IEC 61000-4-6:1996+A1:2000 & IEC 61000-4-6:2001 Edition 1.1
Replaces: EN 61000-4-6:1996
Replaced by: EN 61000-4-6:2007

For: European Union
Ratified/printed: 1 DEC 2000
May use starting: 19 FEB 2001
Must use starting: 1 DEC 2003
Must use until: 15 JUN 2007
May use until: 1 JUN 2010

References:

Referenced by:
* EN 50082-1:1997 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)

Comments:

(hardcopy)


EN 61000-4-6:2007 Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

Equivalent to: IEC 61000-4-6:2003+A1:2004+A2:2006
Replaces: EN 61000-4-6:1996+A1:2000
Replaced by: EN 61000-4-6:2009

For: European Union
Ratified/printed: 1 JUN 2007
May use starting: 15 JUN 2007
Must use starting: 1 JUN 2010
Must use until: 31 MAR 2009
May use until: 1 MAR 2012

References:

Referenced by:
* EN 50082-1:1997 (undated)
* EN 55022:2010
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61547:2009

Comments:

(source)


EN 61000-4-6:2009 Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

Equivalent to: IEC 61000-4-6:2008 Edition 3
Replaces: EN 61000-4-6:2007
Replaced by:

For: European Union
Ratified/printed: 1 MAR 2009
May use starting: 31 MAR 2009
Must use starting: 1 MAR 2012
Must use until:
May use until:

References:
* IEC 60050-161

Referenced by:
* EN 50082-1:1997 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61547:2009

Comments:

(hardcopy & E:\dbi\iec61000-4-6{ed3.0}b.pdf)


ENV 50141:1994 Electromagnetic compatibility - Basic immunity standard - Conducted disturbances induced by radio-frequency fields - Immunity test

Equivalent to:
Replaces:
Replaced by:

For: European Union
Ratified/printed: AUG 1993
May use starting: 16 SEP 1995
Must use starting: 15 MAR 1996
Must use until:
May use until:

References:
* IEC 50(161):1990
* CISPR 16:1987

Referenced by:
* EN 50082-2:1995 (undated)

Comments:

(hardcopy)


IEC 801-6:1993 Electromagnetic compatibility for industrial-process measurement and
control equipment - Part 6: Immunity to conducted disturbances induced by
radio frequency fields

Equivalent to:
Replaces:
Replaced by: IEC 1000-4-6:1996 Edition 1 & IEC 61000-4-6:1996 Edition 1

For:
Ratified/printed:
May use starting:
Must use starting:
Must use until:
May use until:

References:
* CISPR 16:1987
* IEC 50(161):1990

Referenced by:

Comments:

(hardcopy)


IEC 1000-4-6:1996 Edition 1 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 6: Immunity to conducted disturbances, induced by radio-frequency fields

Equivalent to: EN 61000-4-6:1996 & IEC 61000-4-6:1996 Edition 1 (reissued 1 JAN 1997)

Replaces: IEC 801-6:1993
Replaced by: IEC 61000-4-6:1996+A1:2000 & IEC 61000-4-6:2001 Edition 1.1

For:
Ratified/printed: MAR 1996
May use starting: MAR 1996
Must use starting: MAR 1996
Must use until:
May use until:

References:
* CISPR 16-1:1993
* CISPR 20:1990
* IEC 50(131):1978
* IEC 50(161):1990
* IEC 1000-4-3:1995

Referenced by:
* CISPR 14-2:1997 Edition 1
* EN 61000-4-3:1996
* EN 61547:1995
* IEC 1000-4-3:1995 Edition 1
* IEC 61000-4-3:1995 Edition 1
* IEC 61547:1995 Edition 1

Comments:

(hardcopy)


IEC 61000-4-6:1996 Edition 1 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 6: Immunity to conducted disturbances, induced by radio-frequency fields

Equivalent to: EN 61000-4-6:1996 & IEC 1000-4-6:1996 Edition 1 (reissued 1 JAN 1997
Replaces: IEC 801-6:1993
Replaced by: IEC 61000-4-6:1996+A1:2000 & IEC 61000-4-6:2001 Edition 1.1

For:
Ratified/printed: MAR 1996
May use starting: MAR 1996
Must use starting: MAR 1996
Must use until: NOV 2000
May use until: NOV 2000

References:
* CISPR 16-1:1993
* CISPR 20:1990
* IEC 50(131):1978
* IEC 50(161):1990
* IEC 1000-4-3:1995

Referenced by:
* AS/NZS CISPR 14.2:2003
* AS/NZS CISPR 22:2004
* AS/NZS CISPR 24:2002
* CAN/CSA-CEI/IEC CISPR 22:02
* CISPR 14-2:1997+A1:2001
* CISPR 22:1997 Edition 3
* CISPR 22:2003 Edition 4
* CISPR 24:1997 Edition 1
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-4-3:2002 Edition 2
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:1999 Edition 1
* IEC 61000-6-2:2005 (undated)
* IEC 61326:2002 Edition 1

Comments:

(hardcopy)


IEC 61000-4-6:1996+A1:2000, or consolidated edition IEC 61000-4-6:2001 Edition 1.1 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 6: Immunity to conducted disturbances, induced by radio-frequency fields

Equivalent to: EN 61000-4-6:1996+A1:2000 & Replaces: IEC 1000-4-6:1996 Edition 1 & IEC 61000-4-6:1996 Edition 1
Replaced by: IEC 61000-4-6:2003 Edition 2

For:
Ratified/printed: NOV 2000
May use starting: NOV 2000
Must use starting: NOV 2000
Must use until:
May use until:

References:
* CISPR 16-1:1993
* CISPR 20:1990
* IEC 50(131):1978
* IEC 50(161):1990
* IEC 1000-4-3:1995

Referenced by:
* EN 50082-1:1997
* EN 61000-6-1:2001
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2001
* EN 61000-6-2:2005 (undated)
* EN 61000-4-3:1996
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:2005 (undated)

Comments: Clause 9 changed - classifications of test results changed to a through d. Clause 10 added - specific information required in test report.

(E:\dbi\iec61000-4-6a1.pdf)


IEC 61000-4-6:2003 Edition 2 Electromagnetic compatibility (EMC) Part 4.6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

Equivalent to:
Replaces: IEC 61000-4-6:1996+A1:2000 & IEC 61000-4-6:2001 Edition 1.1
Replaced by: IEC 61000-4-6:2003+A1:2004 & IEC 61000-4-6:2004 Edition 2.1

For:
Ratified/printed:
May use starting:
Must use starting:
Must use until:
May use until:

References:

Referenced by:
* CISPR 22:2005 Edition 5
* CISPR 22:2006 Edition 6
* CISPR 22:2008
* EN 55022:2006
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* EN 61326-1:2006
* EN 61326-2-3:2006
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:2005 (undated)
* IEC 61326-1:2005 Edition 1
* IEC 61326-2-3:2006 Edition 1

Comments:

(source)


IEC 61000-4-6:2003+A1:2004, or consolidated edition IEC 61000-4-6:2004 Edition 2.1 Electromagnetic compatibility (EMC) Part 4.6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

Equivalent to: AS/NZS 61000.4.6:2006
Replaces: IEC 61000-4-6:2003 Edition 2
Replaced by: IEC 61000-4-6:2003+A1:2004+A2:2006

For:
Ratified/printed:
May use starting:
Must use starting:
Must use until:
May use until:

References:
* IEC 60050(161)

Referenced by:
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:2005 (undated)

Comments:

(hardcopy & E:\dbi\AS_NZS+61000.4.6-2006.pdf)


IEC 61000-4-6:2003+A1:2004+A2:2006 Electromagnetic compatibility (EMC) Part 4.6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

Equivalent to: EN 61000-4-6:2007
Replaces: IEC 61000-4-6:2003+A1:2004 & IEC 61000-4-6:2004 Edition 2.1
Replaced by: IEC 61000-4-6:2008 Edition 3

For:
Ratified/printed:
May use starting:
Must use starting:
Must use until: 31 OCT 2008
May use until: 31 OCT 2008

References:
* IEC 60050(161)

Referenced by:
* CISPR 14-2:1997+A1:2001+A2:2008
* EN 55014-2:1997+A1:2001+A2:2008
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:2005 (undated)

Comments:

(source)


IEC 61000-4-6:2008 Edition 3 Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

Equivalent to: EN 61000-4-6:2009
Replaces: IEC 61000-4-6:2003+A1:2004+A2:2006
Replaced by:

For:
Ratified/printed: 31 OCT 2008
May use starting: 31 OCT 2008
Must use starting: 31 OCT 2008
Must use until:
May use until:

References:
* IEC 60050-161

Referenced by:
* CISPR 24:2010 2nd
* EN 55024:1998+A1:2001+A2:2003
* EN 61000-4-3:2006 (undated)
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-4-3:2006 Edition 3 (undated)
* IEC 61000-6-1:1997 Edition 1 (undated)
* IEC 61000-6-1:2005 Edition 2 (undated)
* IEC 61000-6-2:2005 Edition 2 (undated)
* IEC 61547:2009 Edition 2

Comments:

(hardcopy & E:\dbi\iec61000-4-6{ed3.0}b.pdf)


DISCLAIMER
These web pages are freely offered to anyone who wishes to use them. No warranty for their use is expressed or implied. The most-current versions may be downloaded from the our web site at http://www.dbicorporation.com/.

These web pages can point you to regulations and standards applying to your product(s), but please refer to the regulations and standards themselves when deciding how to test your product(s). A regulation's or standard's title gives you strong clues as to what it covers, but its scope (usually section 1) tells you for sure. Carefully check the footnotes in tables, to see if your product falls into an exception that lets you avoid unnecessary tests (or sometimes requires additional special testing). Exceptions that can help you also sometimes hide in the Test Setup section (usually section 7). Also check the Test Report section (usually section 10) for any special documentation required.

COMMENTS
If you refer to one or more of these documents in written communications, please attribute them to http://www.dbicorporation.com/. Similarly, if you link to them from your own web page(s), we would appreciate an E-mail to jrbarnes@iglou.com giving the universal resource link (URL) so that we may provide a reciprocal link.

Please send critiques, corrections, and/or additions to jrbarnes@iglou.com , or by snailmail to:
John Barnes
216 Hillsboro Ave
Lexington, KY 40511-2105

dBi Corporation was a one-man test house (testing laboratory) based in Lexington, Kentucky, testing a wide variety of commercial electronic products for electromagnetic compatibility (EMC), electromagnetic interference (EMI), and electrostatic discharge (ESD) under its ISO 17025 accreditation. dBi was founded in Winchester, Kentucky in 1995 by Donald R. Bush, shortly after he retired from 30 years service with IBM Lexington's/ Lexmark's EMC Lab. John R. Barnes, who'd worked with Don at IBM Lexington and Lexmark, bought dBi in 2002 after Don's death, and moved the company to Lexington, Kentucky. John closed dBi at 11:59pm EDT on September 30, 2013, because ObamaCrap had increased operating expenses to the point that we could no longer afford to remain in business.

We'd like to thank all of the clients who chose dBi to test their products from 1995 to 2013. Below is a brief summary of our accomplishments during the 18 years we were in business.

From 1995 to 2001, under Don Bush's ownership and operation, dBi:

From 2002 to 2013, under John Barnes' ownership and operation, dBi:

Go to Main Web Site Index Go to Full Standards Index Go to ITE Standards Index Go to Residential/ Commercial Standards Index Go to Industrial Standards Index
Go to Lab Equipment Standards Index Go to Audio/ Video Equipment Standards Index Go to Lamps/ Luminaires Standards Index Go to Appliance Standards Index
Last revised December 3, 2011.