Electrical Fast Transient/Burst (EFTB) Standards for Commercial Electronic Products

This web site is being maintained by John R. Barnes, who was the President and Chief Engineer of dBi Corporation from 2002 to September 30, 2013, when we closed because ObamaCrap made it too expensive for us to remain in business.

John R. Barnes KS4GL, PE, NCE, NCT, ESDC Eng, ESDC Tech, PSE, Master EMC Design Engineer, SM IEEE
December 3, 2011
jrbarnes@iglou.com

Electrical Fast Transient/Burst (EFTB) tests check the behavior of products when there are fast transients, or bursts of fast transients, on:

EFTB is usually caused by:

Because these are relatively-rare events, most product immunity standards require the product to meet Performance Criterion B during EFTB. I.e., the product may act up, as long as it recovers without user intervention.

The table below summarizes the evolution of EFTB standards for commercial electronic products. Medical electronics and military electronics may have their own special requirements. The links take you to summaries of the standards and their amendments. "(Modified)" means that the standard/ amendment differs from the reference standard/ amendment. Entries in bold text are currently active for undated references. Please note that in Australia and New Zealand, products only need to comply with safety and emission standards to bear the C-Tick mark.

Evolution of Electrical Fast Transient/Burst Standards for Commercial Electronic Products
Year Reference Year European Union Year Australia & New Zealand Notes
1988 IEC 801-4:1988          
1995 IEC 1000-4-4:1995 Edition 1 1995 EN 61000-4-4:1995      
1997 IEC 61000-4-4:1995 Edition 1   EN 61000-4-4:1995      
2000 IEC 61000-4-4:1995 +A1:2000 2000 EN 61000-4-4:1995 +A1:2000      
2001 IEC 61000-4-4:1995 +A1:2000+A2:2001 2001 EN 61000-4-4:1995 +A1:2000+A2:2001      
2004 IEC 61000-4-4:2004 Edition 2 2004 EN 61000-4-4:2004 2006 AS/NZS 61000.4.4:2006  
2010 IEC 61000-4-4:2004+A1:2010 2010 EN 61000-4-4:2004+A1:2010      


AS/NZS 61000.4.4:2006 Electromagnetic compatibility (EMC) - Part 4.4: Testing and measurement techniques - Electrical fast transient/burst immunity test

Equivalent to: EN 61000-4-4:2004 & IEC 61000-4-4:2004 Edition 2
Replaces:
Replaced by:

For: Australia & New Zealand
Ratified/printed: 1 JUN 2006
May use starting: 1 JUN 2006
Must use starting: 1 JUN 2008
Must use until:
May use until:

References:
* IEC 60050-161:1990

Referenced by:
* AS/NZS 61000.6.1:2006 (undated)
* AS/NZS 61000.6.2:2006 (undated)
* AS/NZS CISPR 20:2006 (undated)

Comments:

(hardcopy & E:\dbi\AS_NZS+61000.4.4-2006.pdf)


EN 61000-4-4:1995 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test - Basic EMC publication

Equivalent to: IEC 1000-4-4:1995 Edition 1 & IEC 61000-4-4:1995 Edition 1
Replaces:
Replaced by: EN 61000-4-4:1995+A1:2000

For: European Union
Ratified/printed: 6 MAR 1995
May use starting: 16 SEP 1995
Must use starting: 15 MAR 1996
Must use until:
May use until:

References:
* IEC 50(161):1990
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 55014-2:1997
* EN 55024:1998
* EN 55024:2010
* EN 61000-6-2:1999
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)

Comments:

(hardcopy)


EN 61000-4-4:1995+A1:2000 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test - Basic EMC publication

Equivalent to: IEC 61000-4-4:1995+A1:2000
Replaces: EN 61000-4-4:1995
Replaced by: EN 61000-4-4:1995+A1:2000+A2:2001

For: European Union
Ratified/printed: 1 DEC 2000
May use starting:
Must use starting:
Must use until:
May use until:

References:
* IEC 50(161):1990
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)

Comments:

(source)


EN 61000-4-4:1995+A1:2000+A2:2001 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test - Basic EMC publication

Equivalent to: IEC 61000-4-4:1995+A1:2000+A2:2001
Replaces: EN 61000-4-4:1995+A1:2000
Replaced by: EN 61000-4-4:2004

For: European Union
Ratified/printed: 1 JUL 2001
May use starting:
Must use starting:
Must use until 9 DEC 2004:
May use until: 1 OCT 2007

References:
* IEC 50(161):1990
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)

Comments:

(source)


EN 61000-4-4:2004 Electromagnetic compatibility (EMC) - Part 4.4: Testing and measurement techniques - Electrical fast transient/burst immunity test

Equivalent to: AS/NZS 61000.4.4:2006 & IEC 61000-4-4:2004 Edition 2
Replaces: EN 61000-4-4:1995+A1:2000+A2:2001
Replaced by: EN 61000-4-4:2004+A1:2010

For: European Union
Ratified/printed: 1 OCT 2004
May use starting: 9 DEC 2004
Must use starting: 1 OCT 2007
Must use until:
May use until:

References:
* IEC 60050-161:1990

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 55020:2007
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61547:2009

Comments:

(hardcopy & E:\dbi\AS_NZS+61000.4.4-2006.pdf)


EN 61000-4-4:2004+A1:2010 Electromagnetic compatibility (EMC) - Part 4.4: Testing and measurement techniques - Electrical fast transient/burst immunity test

Equivalent to: IEC 61000-4-4:2004+A1:2010
Replaces: EN 61000-4-4:2004
Replaced by:

For: European Union
Ratified/printed: 1 MAR 2010
May use starting:
Must use starting:
Must use until:
May use until:

References:
* IEC 60050-161:1990

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)

Comments: Verification of coupling/decoupling networks (CDN's).

(hardcopy & E:\dBi\iec61000-4-4-amd1{ed2.0}b.pdf)


IEC 801-4:1988 Electromagnetic compatibility for industrial-process measurement and control equipment - Part 4: Electrical fast transient/burst requirements

Equivalent to:
Replaces:
Replaced by: IEC 1000-4-4:1995 Edition 1 & IEC 61000-4-4:1995 Edition 1

For:
Ratified/printed: 1 JAN 1988
May use starting: 1988
Must use starting: 1988
Must use until: JAN 1995
May use until: JAN 1995

References:

Referenced by:
* EN 50082-1:1992

Comments:

(hardcopy)


IEC 1000-4-4:1995 Edition 1 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test - Basic EMC publication

Equivalent to: EN 61000-4-4:1995 & IEC 61000-4-4:1995 Edition 1 (reissued 1 JAN 1997)
Replaces: IEC 801-4:1988
Replaced by: IEC 61000-4-4:1995+A1:2000

For:
Ratified/printed: JAN 1995
May use starting: JAN 1995
Must use starting: JAN 1995
Must use until: NOV 2000
May use until: NOV 2000

References:
* IEC 50(161):1990
* IEC 68-1:1988

Referenced by:
* CISPR 14-2:1997 Edition 1
* EN 61547:1995
* IEC 61547:1995 Edition 1

Comments:

(hardcopy)


IEC 61000-4-4:1995 Edition 1 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test - Basic EMC publication

Equivalent to: EN 61000-4-4:1995 & IEC 1000-4-4:1995 Edition 1 (reissued 1 JAN 1997)
Replaces: IEC 801-4:1988
Replaced by: IEC 61000-4-4:1995+A1:2000

For:
Ratified/printed: JAN 1995
May use starting: JAN 1995
Must use starting: JAN 1995
Must use until: NOV 2000
May use until: NOV 2000

References:
* IEC 50(161):1990
* IEC 68-1:1988

Referenced by:
* AS/NZS CISPR 14.2:2003
* AS/NZS CISPR 20:2009 (undated)
* AS/NZS CISPR 24:2002
* CISPR 14-2:1997+A1:2001
* CISPR 20:2002 (undated)
* CISPR 20:2006 (undated)
* CISPR 24:1997 Edition 1
* EN 55020:2002 (undated)
* EN 61000-6-1:2007 (undated)
* IEC 61000-6-2:1999
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:1999 Edition 1
* IEC 61000-6-2:2005 (undated)
* IEC 61326:2002 Edition 1

Comments:

(hardcopy)


IEC 61000-4-4:1995+A1:2000 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test - Basic EMC publication

Equivalent to: EN 61000-4-4:1995+A1:2000
Replaces: IEC 1000-4-4:1995 Edition 1 & IEC 61000-4-4:1995 Edition 1
Replaced by: IEC 61000-4-4:1995+A1:2000+A2:2001

For:
Ratified/printed: NOV 2000
May use starting: NOV 2000
Must use starting: NOV 2000
Must use until: JUL 2001
May use until: JUL 2001

References:
* IEC 50(161):1990
* IEC 68-1:1988

Referenced by:
* AS/NZS CISPR 20:2009 (undated)
* CISPR 20:2002 (undated)
* CISPR 20:2006 (undated)
* EN 55020:2002 (undated)
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:2005 (undated)

Comments: Clause 8.1.1 changed - climatic conditions shall be within limits specified for the EUT and the test equipment. Clause 9 changed - classifications of test results changed to a through d. Clause 10 added - specific information required in test report.

(hardcopy & E:\dbi\iec61000-4-4a1.pdf)


IEC 61000-4-4:1995+A1:2000+A2:2001 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test - Basic EMC publication

Equivalent to: EN 61000-4-4:1995+A1:2000+A2:2001
Replaces: IEC 61000-4-4:1995+A1:2000
Replaced by: IEC 61000-4-4:2004 Edition 2

For:
Ratified/printed: JUL 2001
May use starting: JUL 2001
Must use starting: JUL 2001
Must use until: 8 JUL 2004
May use until: 8 JUL 2004

References:
* IEC 50(161):1990
* IEC 68-1:1988

Referenced by:
* AS/NZS CISPR 20:2009 (undated)
* CISPR 20:2002 (undated)
* CISPR 20:2006 (undated)
* EN 55020:2002 (undated)
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:2005 (undated)

Comments: Clauses 6.1.1 and 6.1.2 changed - fast transient/burst generator characterized with 1k and 50-ohm loads.

(hardcopy & E:\dbi\iec61000-4-4a2.pdf)


IEC 61000-4-4:2004 Edition 2 Electromagnetic compatibility (EMC) - Part 4.4: Testing and measurement techniques - Electrical fast transient/burst immunity test

Equivalent to: EN 61000-4-4:2004 & AS/NZS 61000.4.4:2006
Replaces: IEC 61000-4-4:1995+A1:2000+A2:2001
Replaced by: IEC 61000-4-4:2004+A1:2010

For:
Ratified/printed: 8 JUL 2004
May use starting: 8 JUL 2004
Must use starting: 8 JUL 2004
Must use until:
May use until:

References:
* IEC 60050-161:1990

Referenced by:
* AS/NZS CISPR 20:2009 (undated)
* CISPR 14-2:1997+A1:2001+A2:2008
* CISPR 20:2002 Edition 5 (undated)
* CISPR 20:2006 Edition 6 (undated)
* CISPR 24:2010 2nd
* EN 55014-2:1997+A1:2001+A2:2008
* EN 55020:2002 (undated)
* EN 55024:1998+A1:2001+A2:2003
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* EN 61326-1:2006
* EN 61326-2-3:2006
* IEC 61000-6-1:1997 Edition 1 (undated)
* IEC 61000-6-1:2005 Edition 2 (undated)
* IEC 61000-6-2:2005 Edition 2 (undated)
* IEC 61326-1:2005 Edition 1
* IEC 61326-2-3:2006 Edition 1
* IEC 61547:2009

Comments:

(hardcopy & E:\dbi\AS_NZS+61000.4.4-2006.pdf)


IEC 61000-4-4:2004+A1:2010 Electromagnetic compatibility (EMC) - Part 4.4: Testing and measurement techniques - Electrical fast transient/burst immunity test

Equivalent to: EN 61000-4-4:2004+A1:2010
Replaces: IEC 61000-4-4:2004
Replaced by:

For:
Ratified/printed: 21 JAN 2010
May use starting: 21 JAN 2010
Must use starting: 21 JAN 2010
Must use until:
May use until:

References:
* IEC 60050-161:1990

Referenced by:
* AS/NZS CISPR 20:2009 (undated)
* CISPR 20:2002 Edition 5 (undated)
* CISPR 20:2006 Edition 6 (undated)
* EN 55020:2002 (undated)
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 Edition 1 (undated)
* IEC 61000-6-1:2005 Edition 2 (undated)
* IEC 61000-6-2:2005 Edition 2 (undated)

Comments: Verification of coupling/decoupling networks (CDN's).

(hardcopy & E:\dBi\iec61000-4-4-amd1{ed2.0}b.pdf)


DISCLAIMER
These web pages are freely offered to anyone who wishes to use them. No warranty for their use is expressed or implied. The most-current versions may be downloaded from the our web site at http://www.dbicorporation.com/.

These web pages can point you to regulations and standards applying to your product(s), but please refer to the regulations and standards themselves when deciding how to test your product(s). A regulation's or standard's title gives you strong clues as to what it covers, but its scope (usually section 1) tells you for sure. Carefully check the footnotes in tables, to see if your product falls into an exception that lets you avoid unnecessary tests (or sometimes requires additional special testing). Exceptions that can help you also sometimes hide in the Test Setup section (usually section 7). Also check the Test Report section (usually section 10) for any special documentation required.

COMMENTS
If you refer to one or more of these documents in written communications, please attribute them to http://www.dbicorporation.com/. Similarly, if you link to them from your own web page(s), we would appreciate an E-mail to jrbarnes@iglou.com giving the universal resource link (URL) so that we may provide a reciprocal link.

Please send critiques, corrections, and/or additions to jrbarnes@iglou.com , or by snailmail to:
John Barnes
216 Hillsboro Ave
Lexington, KY 40511-2105

dBi Corporation was a one-man test house (testing laboratory) based in Lexington, Kentucky, testing a wide variety of commercial electronic products for electromagnetic compatibility (EMC), electromagnetic interference (EMI), and electrostatic discharge (ESD) under its ISO 17025 accreditation. dBi was founded in Winchester, Kentucky in 1995 by Donald R. Bush, shortly after he retired from 30 years service with IBM Lexington's/ Lexmark's EMC Lab. John R. Barnes, who'd worked with Don at IBM Lexington and Lexmark, bought dBi in 2002 after Don's death, and moved the company to Lexington, Kentucky. John closed dBi at 11:59pm EDT on September 30, 2013, because ObamaCrap had increased operating expenses to the point that we could no longer afford to remain in business.

We'd like to thank all of the clients who chose dBi to test their products from 1995 to 2013. Below is a brief summary of our accomplishments during the 18 years we were in business.

From 1995 to 2001, under Don Bush's ownership and operation, dBi:

From 2002 to 2013, under John Barnes' ownership and operation, dBi:

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Last revised December 3, 2011.