Electrostatic Discharge (ESD) Standards for Commercial Electronic Products

This web site is being maintained by John R. Barnes, who was the President and Chief Engineer of dBi Corporation from 2002 to September 30, 2013, when we closed because ObamaCrap made it too expensive for us to remain in business.

John R. Barnes KS4GL, PE, NCE, NCT, ESDC Eng, ESDC Tech, PSE, Master EMC Design Engineer, SM IEEE
December 3, 2011
jrbarnes@iglou.com

Electrostatic Discharge (ESD) tests check the behavior of products when exposed to discharges to:

The product (direct discharges).
Nearby metal objects (indirect discharges).

Electric charge can build up on an object, such as a human body, when different materials rub together or slide across one another (triboelectric effect). If this charge doesn't have a chance to bleed off, it can create a high potential (voltage) on the object. Then, if the object gets close enough to a conductive object at a different potential, the excess charge will jump between them in a sudden arc of up to 100 amps, lasting a few nanoseconds. If this current spike gets into a sensitive electronic component, it can degrade, damage, or destroy the device. Even if the ESD arc doesn't cause direct damage, it generates intense electromagnetic fields from about 1MHz to 500MHz, that can couple into sensitive circuits and upset the product.

Because ESD discharges are relatively-rare events, most product immunity standards require the product to meet Performance Criterion B during ESD. I.e., the product may act up, as long as it recovers without user intervention.

The table below summarizes the evolution of ESD Immunity standards for commercial electronic products. Medical electronics and military electronics may have their own special requirements. The links take you to summaries of the standards and their amendments. "(Modified)" means that the standard/ amendment differs from the reference standard/ amendment. Entries in bold text are currently active for undated references. Please note that in Australia and New Zealand, products only need to comply with safety and emission standards to bear the C-Tick mark.

Evolution of Electrostatic Discharge Standards for Commercial Electronic Products

Year Reference Year European Union Year Australia & New Zealand Notes

1984 IEC 801-2:1984 Edition 1

1991 IEC 801-2:1991 Edition 2

1995 IEC 1000-4-2:1995 Edition 1 1995 EN 61000-4-2:1995

1997 IEC 61000-4-2:1995 Edition 1 EN 61000-4-2:1995

1998 IEC 61000-4-2:1995 +A1:1998 1998 EN 61000-4-2:1995 +A1:1998

2000 IEC 61000-4-2:1995 +A1:1998+A2:2000
IEC 61000-4-2:2001 Edition 1.2
2001 EN 61000-4-2:1995 +A1:1998+A2:2001 (may use until 1 MAR 2012 2002 AS/NZS 61000.4.2:2002

2008 IEC 61000-4-2:2008 Edition 2 2009 EN 61000-4-2:2009

Year	Reference	Year	European Union	Year	Australia & New Zealand
1984	IEC 801-2:1984 Edition 1
1991	IEC 801-2:1991 Edition 2
1995	IEC 1000-4-2:1995 Edition 1	1995	EN 61000-4-2:1995
1997	IEC 61000-4-2:1995 Edition 1		EN 61000-4-2:1995
1998	IEC 61000-4-2:1995 +A1:1998	1998	EN 61000-4-2:1995 +A1:1998
2000	IEC 61000-4-2:1995 +A1:1998+A2:2000 IEC 61000-4-2:2001 Edition 1.2	2001	EN 61000-4-2:1995 +A1:1998+A2:2001 (may use until 1 MAR 2012	2002	AS/NZS 61000.4.2:2002
2008	IEC 61000-4-2:2008 Edition 2	2009	EN 61000-4-2:2009

AS/NZS 61000.4.2:2002 Electromagnetic compatibility (EMC) - Part 4.2: Testing and measurement techniques - Electrostatic discharge immunity test

Equivalent to: IEC 61000-4-2:1995+A1:1998+A2:2000, & IEC 61000-4-2:2001 Edition 1.2
Replaces:
Replaced by:

For: Australia & New Zealand
Ratified/printed: 1 NOV 2002
May use starting: 1 NOV 2002
Must use starting: 1 NOV 2004
Must use until:
May use until:

References:
* IEC 60050(161):1990
* IEC 60068-1:1988

Referenced by:
* AS/NZS 61000.6.1:2006 (undated)
* AS/NZS 61000.6.2:2006 (undated)
* AS/NZS CISPR 20:2006 (undated)

Comments:

(hardcopy & E:\dbi\AS_NZS+61000.4.2-2002.pdf)

EN 61000-4-2:1995 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 2: Electrostatic discharge immunity test - Basic EMC Publication

Equivalent to: IEC 1000-4-2:1995 Edition 1 & IEC 61000-4-2:1995 Edition 1
Replaces:
Replaced by: EN 61000-4-2:1995+A1:1998

For: European Union
Ratified/printed: 6 MAR 1995
May use starting: 22 MAR 1995
Must use starting: 1 MAR 1996
Must use until: 1 APR 1998
May use until: 1 JAN 2001

References:
* EN 60068-1:1994
* IEC 50(161):1990

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 55014-2:1997
* EN 55024:1998
* EN 55024:2010
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:1999
* EN 61000-6-2:2001 (undated)

Comments:

(hardcopy)

EN 61000-4-2:1995+A1:1998 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 2: Electrostatic discharge immunity test - Basic EMC Publication

Equivalent to: IEC 61000-4-2:1995+A1:1998
Replaces: EN 61000-4-2:1995
Replaced by: EN 61000-4-2:1995+A1:1998+A2:2001

For: European Union
Ratified/printed: 1 APR 1998
May use starting: 1 APR 1998
Must use starting: 1 JAN 2001
Must use until: 15 FEB 2001
May use until: 1 DEC 2003

References:
* EN 60068-1:1994
* IEC 50(161):1990

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 55020:2007
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)

Comments: Clause 8.3.2.1 changed - discharges to the front of the horizontal coupling plane are now done with the ESD gun horizontal.

(hardcopy & E:\dbi\iec61000-4-2a1.pdf)

EN 61000-4-2:1995+A1:1998+A2:2001 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 2: Electrostatic discharge immunity test - Basic EMC Publication

Equivalent to: IEC 61000-4-2:1995+A1:1998+A2:2000, & IEC 61000-4-2:2001 Edition 1.2
Replaces: EN 61000-4-2:1995+A1:1998
Replaced by: EN 61000-4-2:2009

For: European Union
Ratified/printed: 1 DEC 2000
May use starting: 15 FEB 2001
Must use starting: 1 DEC 2003
Must use until: 31 MAR 2009
May use until: 1 MAR 2012

References:
* EN 60068-1:1994
* IEC 50(161):1990

Referenced by:

* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)

Comments: Clause 7.1.3 adds a grounding strap with two 470k resistors when testing ungrounded equipment. Clause 8.3.1 changed - much more detail about direct discharges to the EUT. Clause 9 split into a new clause 9 with just the performance criteria, and clause 10 added with test report requirements.

(hardcopy & E:\dbi\iec61000-4-2a2.pdf)

EN 61000-4-2:2009 Electromagnetic compatibility (EMC) - Part 4.2: Testing and measurement techniques - Electrostatic discharge immunity test

Equivalent to: IEC 61000-4-2:2008 Edition 2
Replaces: EN 61000-4-2:1995+A1:1998+A2:2001
Replaced by:

For: European Union
Ratified/printed: 1 MAR 2009
May use starting: 31 MAR 2009
Must use starting: 1 MAR 2012
Must use until:
May use until:

References:
* EN 60068-1:1994
* IEC 60050-161

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61547:2009

Comments:

(hardcopy & E:\dbi\I.S. EN 61000-4-2-2009.pdf)

IEC 801-2:1984 Edition 1 Electromagnetic compatibility for industrial-process measurement and control equipment - Part 2: Electrostatic discharge requirements

Equivalent to:
Replaces:
Replaced by: IEC 801-2:1:1991 Edition 2

For:
Ratified/printed: 1 JAN 1984
May use starting: 1984
Must use starting: 1984
Must use until: APR 1991
May use until: APR 1991

References:

Referenced by:
* EN 50082-1:1992
* EN 55011:1991 (undated)

Comments:

(hardcopy)

IEC 801-2:1991 Edition 2 Electromagnetic compatibility for industrial-process measurement and control equipment - Part 2: Electrostatic discharge requirements

Equivalent to:
Replaces: IEC 801-2:1984 Edition 1
Replaced by: IEC 1000-4-2:1995 Edition 1 & IEC 61000-4-2:1995 Edition 1

For:
Ratified/printed: 30 APR 1991
May use starting: APR 1991
Must use starting: APR 1991
Must use until: JAN 1995
May use until: JAN 1995

References:
* IEC 50(161):1990

Referenced by:
* EN 50082-1:1992
* EN 55011:1991 (undated)
* EN 55011:1991+A1:1997+A2:1996 (undated)

Comments:

(hardcopy)

IEC 1000-4-2:1995 Edition 1 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 2: Electrostatic discharge immunity test - Basic EMC Publication

Equivalent to: IEC 61000-4-2:1995 Edition 1 (reissued 1 JAN 1997)
Replaces: IEC 801-2:1:1991 Edition 2
Replaced by: IEC 61000-4-2:1995+A1:1998

For:
Ratified/printed: JAN 1995
May use starting: JAN 1995
Must use starting: JAN 1995
Must use until: 1998
May use until: 1998

References:
* IEC 50(161):1990
* IEC 68-1:1988

Referenced by:
* CISPR 14-2:1997 Edition 1
* EN 61547:1995
* IEC 61547:1995 Edition 1

Comments:

(hardcopy)

IEC 61000-4-2:1995 Edition 1 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 2: Electrostatic discharge immunity test - Basic EMC Publication

Equivalent to: IEC 1000-4-2:1995 Edition 1 (reissued 1 JAN 1997)
Replaces: IEC 801-2:1:1991 Edition 2
Replaced by: IEC 61000-4-2:1995+A1:1998

For:
Ratified/printed: JAN 1995
May use starting: JAN 1995
Must use starting: JAN 1995
Must use until: 1998
May use until: 1998

References:
* IEC 50(161):1990
* IEC 68-1:1988

Referenced by:
* AS/NZS CISPR 14.2:2003
* AS/NZS CISPR 20:2009 (undated)
* AS/NZS CISPR 24:2002
* CISPR 14-2:1997+A1:2001
* CISPR 14-2:2001 Edition 1.1
* CISPR 20:2002 (undated)
* CISPR 20:2006 (undated)
* CISPR 24:1997 Edition 1
* EN 55020:2002 (undated)
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:1999
* IEC 61000-6-2:1999 Edition 1
* IEC 61326:2002 Edition 1

Comments:

(hardcopy)

IEC 61000-4-2:1995+A1:1998 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 2: Electrostatic discharge immunity test - Basic EMC Publication

Equivalent to: EN 61000-4-2:1995+A1:1998
Replaces: IEC 1000-4-2:1995 Edition 1 & IEC 61000-4-2:1995 Edition 1
Replaced by: IEC 61000-4-2:1995+A1:1998+A2:2000 & IEC 61000-4-2:2001 Edition 1.2

For:
Ratified/printed: 1998
May use starting: 1998
Must use starting: 1998
Must use until: NOV 2000
May use until: NOV 2000

References:
* IEC 50(161):1990
* IEC 68-1:1988

Referenced by:
* AS/NZS CISPR 20:2009 (undated)
* CISPR 20:2002 (undated)
* CISPR 20:2006 (undated)
* EN 50082-1:1997
* EN 50082-2:1995
* EN 55020:2002 (undated)
* EN 61000-6-1:2001
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* EN 61000-6-2:2001
* IEC 61000-6-2:2005 (undated)

Comments: Clause 8.3.2.1 changed - discharges to the front of the horizontal coupling plane are done with the ESD gun horizontal.

(hardcopy & E:\dbi\iec61000-4-2a1.pdf)

IEC 61000-4-2:1995+A1:1998+A2:2000, or consolidated edition IEC 61000-4-2:2001 Edition 1.2 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 2: Electrostatic discharge immunity test - Basic EMC Publication

Equivalent to: EN 61000-4-2:1995+A1:1998+A2:2001 & AS/NZS 61000.4.2:2002
Replaces: IEC 61000-4-2:1995+A1:1998
Replaced by: IEC 61000-4-2:2008 Edition 2

For:
Ratified/printed: NOV 2000
May use starting: NOV 2000
Must use starting: NOV 2000
Must use until: 9 DEC 2008
May use until: 9 DEC 2008

References:
* IEC 50(161):1990
* IEC 68-1:1988

Referenced by:
* AS/NZS CISPR 20:2009 (undated)
* CISPR 14-2:1997+A1:2001+A2:2008
* CISPR 20:2002 (undated)
* CISPR 20:2006 (undated)
* EN 55014-2:1997+A1:2001+A2:2008
* EN 55020:2002 (undated)
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* EN 61326-1:2006
* EN 61326-2-3:2006
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:2005 (undated)
* IEC 61326-1:2005 Edition 1
* IEC 61326-2-3:2006 Edition 1

(hardcopy & E:\dbi\iec61000-4-2a2.pdf)

IEC 61000-4-2:2008 Edition 2 Electromagnetic compatibility (EMC) - Part 4.2: Testing and measurement techniques - Electrostatic discharge immunity test

Equivalent to: EN 61000-4-2:2008
Replaces: IEC 61000-4-2:1995+A1:1998+A2:2000 & IEC 61000-4-2:2001 Edition 1.2
Replaced by:

For:
Ratified/printed: 9 DEC 2008
May use starting: 9 DEC 2008
Must use starting: 9 DEC 2008
Must use until:
May use until:

References:
* IEC 60050(161)
* IEC 60068-1

Referenced by:
* AS/NZS CISPR 20:2009 (undated)
* CISPR 20:2002 (undated)
* CISPR 20:2006 (undated)
* CISPR 24:2010 2nd
* EN 55020:2002 (undated)
* EN 55024:1998+A1:2001+A2:2003
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 Edition 1 (undated)
* IEC 61000-6-1:2005 Edition 2 (undated)
* EN 61000-6-1:2007 (undated)
* IEC 61000-6-2:2005 Edition 2 (undated)
* IEC 61547:2009 Edition 2

Comments:

(hardcopy & E:\dbi\I.S. EN 61000-4-2-2009.pdf)

DISCLAIMER These web pages are freely offered to anyone who wishes to use them. No warranty for their use is expressed or implied. The most-current versions may be downloaded from the our web site at http://www.dbicorporation.com/.

These web pages can point you to regulations and standards applying to your product(s), but please refer to the regulations and standards themselves when deciding how to test your product(s). A regulation's or standard's title gives you strong clues as to what it covers, but its scope (usually section 1) tells you for sure. Carefully check the footnotes in tables, to see if your product falls into an exception that lets you avoid unnecessary tests (or sometimes requires additional special testing). Exceptions that can help you also sometimes hide in the Test Setup section (usually section 7). Also check the Test Report section (usually section 10) for any special documentation required.

COMMENTS If you refer to one or more of these documents in written communications, please attribute them to http://www.dbicorporation.com/. Similarly, if you link to them from your own web page(s), we would appreciate an E-mail to jrbarnes@iglou.com giving the universal resource link (URL) so that we may provide a reciprocal link.

Please send critiques, corrections, and/or additions to jrbarnes@iglou.com , or by snailmail to:
John Barnes
216 Hillsboro Ave
Lexington, KY 40511-2105

dBi Corporation was a one-man test house (testing laboratory) based in Lexington, Kentucky, testing a wide variety of commercial electronic products for electromagnetic compatibility (EMC), electromagnetic interference (EMI), and electrostatic discharge (ESD) under its ISO 17025 accreditation. dBi was founded in Winchester, Kentucky in 1995 by Donald R. Bush, shortly after he retired from 30 years service with IBM Lexington's/ Lexmark's EMC Lab. John R. Barnes, who'd worked with Don at IBM Lexington and Lexmark, bought dBi in 2002 after Don's death, and moved the company to Lexington, Kentucky. John closed dBi at 11:59pm EDT on September 30, 2013, because ObamaCrap had increased operating expenses to the point that we could no longer afford to remain in business.

We'd like to thank all of the clients who chose dBi to test their products from 1995 to 2013. Below is a brief summary of our accomplishments during the 18 years we were in business.

From 1995 to 2001, under Don Bush's ownership and operation, dBi:

Did the official approval testing of 141 products developed by 20 client companies.
Did the official FCC/ Industry Canada (IC) Verification and Declaration of Conformity (DoC) testing of 92 products.
Did the official FCC/IC Certification testing of 15 products.
Did the official CE Marking testing of 100 products.

From 2002 to 2013, under John Barnes' ownership and operation, dBi:

Tested 389 products and 2 testers developed by 44 client companies.
Did the official approval testing of 357 products and 2 testers, getting all but 5 of them to meet all of the FCC, Industry Canada (IC), CE Marking, C-Tick, and Regulatory Compliance Mark (RCM) standards and requirements for their desired market areas.
Did the official FCC/IC Verification and Declaration of Conformity (DoC) testing of 296 products.
Did the official FCC/IC Certification testing of 24 products.
Did the official CE Marking testing of 271 products and 2 testers.
Did the official e-Mark testing of 3 products.
Did the official Australia/New Zealand Verification testing of 170 products.
Co-sponsored John's writing the Robust Electronic Design Reference Book, Volumes I and II.
Served as an expert witness on electronics in three lawsuits.

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Last revised December 3, 2011.

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