Magnetic Field Immunity Standards for Commercial Electronic Products

This web site is being maintained by John R. Barnes, who was the President and Chief Engineer of dBi Corporation from 2002 to September 30, 2013, when we closed because ObamaCrap made it too expensive for us to remain in business.

John R. Barnes KS4GL, PE, NCE, NCT, ESDC Eng, ESDC Tech, PSE, Master EMC Design Engineer, SM IEEE
December 3, 2011
jrbarnes@iglou.com

Magnetic Field Immunity tests check the behavior of products when exposed to powerline- frequency magnetic fields, such as from poorly- routed power wiring. Because these fields are continuous, and out of the user's control, immunity standards require the product to meet Performance Criterion A. I.e., it must operate normally, without any user intervention.

The table below summarizes the evolution of Magnetic Field Immunity standards for commercial electronic products. Medical electronics and military electronics may have their own special requirements. The links take you to summaries of the standards and their amendments. "(Modified)" means that the standard/ amendment differs from the reference standard/ amendment. Entries in bold text are currently active for undated references. Please note that in Australia and New Zealand, products only need to comply with safety and emission standards to bear the C-Tick mark.

Evolution of Magnetic Field Immunity Standards for Commercial Electronic Products

Year Reference Year European Union Year Australia & New Zealand Notes

1993 IEC 1000-4-8:1993 Edition 1 1993 EN 61000-4-8:1993

1997 IEC 61000-4-8:1993 Edition 1 EN 61000-4-8:1993

2000 IEC 61000-4-8:1993 +A1:2000
IEC 61000-4-8:2001 Edition 1.1
2001 EN 61000-4-8:1993 +A1:2001 2002 AS/NZS 61000.4.8:2002

2009 IEC 61000-4-8:2009 Edition 2 2010; EN 61000-4-8:2010

Year	Reference	Year	European Union	Year	Australia & New Zealand
1993	IEC 1000-4-8:1993 Edition 1	1993	EN 61000-4-8:1993
1997	IEC 61000-4-8:1993 Edition 1		EN 61000-4-8:1993
2000	IEC 61000-4-8:1993 +A1:2000 IEC 61000-4-8:2001 Edition 1.1	2001	EN 61000-4-8:1993 +A1:2001	2002	AS/NZS 61000.4.8:2002
2009	IEC 61000-4-8:2009 Edition 2	2010;	EN 61000-4-8:2010

AS/NZS 61000.4.8:2002 Electromagnetic compatibility (EMC) Part 4.8: Testing and measurement techniques - Power frequency magnetic field immunity test

Equivalent to: IEC 61000-4-8:1993+A1:2000 & IEC 61000-4-8:2001 Edition 1.1
Replaces:
Replaced by:

For: Australia & New Zealand
Ratified/printed: 1 NOV 2002
May use starting: 1 NOV 2002
Must use starting: 1 NOV 2004
Must use until:
May use until:

References:
* IEC 60068-1:1988

Referenced by:
* AS/NZS 61000.6.1:2006 (undated)
* AS/NZS 61000.6.2:2006 (undated)

Comments:

(hardcopy & E:\dbi\AS_NZS+61000.4.8-2002.pdf)

EN 61000-4-8:1993 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 8: Power frequency magnetic field immunity test - Basic EMC Publication

Equivalent to: IEC 1000-4-8:1993 Edition 1 & IEC 61000-4-8:1993 Edition 1
Replaces:
Replaced by: EN 61000-4-8:1993+A1:2001

For: European Union
Ratified/printed: 16 JUN 1992
May use starting: 29 SEP 1993
Must use starting: 1 JUN 1994
Must use until: 1 DEC 2000
May use until: 1 DEC 2003

References:
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 55024:1998
* EN 55024:2010
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:1999
* EN 61000-6-2:2001 (undated)
* EN 61547:2009
* IEC 61000-4-6:2003+A1:2004

Comments:

(hardcopy)

EN 61000-4-8:1993+A1:2001 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 8: Power frequency magnetic field immunity test - Basic EMC Publication

Equivalent to: IEC 61000-4-8:1993+A1:2000 & IEC 61000-4-8:2001 Edition 1.1
Replaces: EN 61000-4-8:1993
Replaced by: EN 61000-4-8:2010

For: European Union
Ratified/printed: 1 DEC 2000
May use starting: 1 DEC 2000
Must use starting: 1 DEC 2003
Must use until:
May use until:

References:
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61547:2009

Comments:

(hardcopy & E:\dbi\AS_NZS+61000.4.8-2002.pdf & E:\dbi\iec61000-4-8.pdf)

EN 61000-4-8:2010 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 8: Power frequency magnetic field immunity test - Basic EMC Publication

Equivalent to: IEC 61000-4-8:2009 Edition 2
Replaces: EN 61000-4-8:1993+A1:2001
Replaced by:

For: European Union
Ratified/printed: 1 FEB 2010
May use starting:
Must use starting:
Must use until:
May use until:

References:
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)

Comments:

(hardcopy & E:\dbi\I.S. EN 61000-4-8-2010 Electromagnetic Compatibility (emc) - Part 4-8- Testing and Measurement Techniques - P.pdf)

IEC 1000-4-8:1993 Edition 1 (reissued 1 JAN 1997) Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 8: Power frequency magnetic field immunity test - Basic EMC Publication

Equivalent to: EN 61000-4-8:1993 & IEC 61000-4-8:1993 Issue 1 (reissued 1 JAN 1997)
Replaces:
Replaced by: IEC 61000-4-8:1993+A1:2000

For:
Ratified/printed: JUN 1993
May use starting: JUN 1993
Must use starting: JUN 1993
Must use until: MAR 2001
May use until: MAR 2001

References:
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61547:1995
* IEC 61547:1995 Edition 1

Comments:

(hardcopy)

IEC 61000-4-8:1993 Edition 1 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 8: Power frequency magnetic field immunity test - Basic EMC Publication

Equivalent to: EN 61000-4-8:1993 & IEC 1000-4-8:1993 Edition 1 (reissued 1 JAN 1997)
Replaces:
Replaced by: IEC 61000-4-8:1993+A1:2000 & IEC 61000-4-8:2001

For:
Ratified/printed: JUN 1993
May use starting: JUN 1993
Must use starting: JUN 1993
Must use until: MAR 2001
May use until: MAR 2001

References:
* IEC 68-1:1988

Referenced by:
* AS/NZS CISPR 24:2002
* CISPR 24:1997 Edition 1
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61000-6-2:2005 (undated)
* EN 61326-1:2006
* EN 61326-2-3:2006
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:1999 Edition 1
* IEC 61000-6-2:2005 (undated)
* IEC 61326:2002 Edition 1
* IEC 61326-1:2005 Edition 1
* IEC 61326-2-3:2006 Edition 1
* IEC 61547:2009 Edition 2

Comments:

(hardcopy)

IEC 61000-4-8:1993+A1:2000 or consolidated edition IEC 61000-4-8:2001 Edition 1.1 Electromagnetic compatibility (EMC) Part 4.8: Testing and measurement techniques - Power frequency magnetic field immunity test

Equivalent to: EN 61000-4-8:1993+A1:2001 & AS/NZS 61000.4.8:2002
Replaces: IEC 1000-4-8:1993 Edition 1 & IEC 61000-4-8:1993 Edition 1
Replaced by: IEC 61000-4-8:2009 Edition 2

For:
Ratified/printed: MAR 2001
May use starting: MAR 2001
Must use starting: MAR 2001
Must use until: 3 SEP 2009
May use until: 3 SEP 2009

References:
* IEC 68-1:1988

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 Edition 1 (undated)
* IEC 61000-6-1:2005 Edition 2 (undated)
* IEC 61000-6-2:2005 Edition 2 (undated)

Comments: Clause 8.1.1 changed - climatic conditions shall be within limits specified for the EUT and the test equipment. Clause 9 changed - classifications of test results changed to a through d. Clause 10 added - specific information required in test report.

(hardcopy & E:\dbi\AS_NZS+61000.4.8-2002.pdf & E:\dbi\iec61000-4-8.pdf)

IEC 61000-4-8:2009 Edition 2 Electromagnetic compatibility (EMC) Part 4.8: Testing and measurement techniques - Power frequency magnetic field immunity test

Equivalent to: EN 61000-4-8:2010
Replaces: IEC 61000-4-8:1993+A1:2000 & IEC 61000-4-8:2001 Edition 1.1
Replaced by:

For:
Ratified/printed: 3 SEP 2009
May use starting: 3 SEP 2009
Must use starting: 3 SEP 2009
Must use until:
May use until:

References:

Referenced by:
* EN 50082-1:1997 (undated)
* EN 50082-2:1995 (undated)
* EN 61000-6-1:2001 (undated)
* EN 61000-6-1:2007 (undated)
* EN 61000-6-2:2001 (undated)
* EN 61000-6-2:2005 (undated)
* IEC 61000-6-1:1997 (undated)
* IEC 61000-6-1:2005 (undated)
* IEC 61000-6-2:2005 (undated)

Comments:

(source)

DISCLAIMER These web pages are freely offered to anyone who wishes to use them. No warranty for their use is expressed or implied. The most-current versions may be downloaded from the our web site at http://www.dbicorporation.com/.

These web pages can point you to regulations and standards applying to your product(s), but please refer to the regulations and standards themselves when deciding how to test your product(s). A regulation's or standard's title gives you strong clues as to what it covers, but its scope (usually section 1) tells you for sure. Carefully check the footnotes in tables, to see if your product falls into an exception that lets you avoid unnecessary tests (or sometimes requires additional special testing). Exceptions that can help you also sometimes hide in the Test Setup section (usually section 7). Also check the Test Report section (usually section 10) for any special documentation required.

COMMENTS If you refer to one or more of these documents in written communications, please attribute them to http://www.dbicorporation.com/. Similarly, if you link to them from your own web page(s), we would appreciate an E-mail to jrbarnes@iglou.com giving the universal resource link (URL) so that we may provide a reciprocal link.

Please send critiques, corrections, and/or additions to jrbarnes@iglou.com , or by snailmail to:
John Barnes
216 Hillsboro Ave
Lexington, KY 40511-2105

dBi Corporation was a one-man test house (testing laboratory) based in Lexington, Kentucky, testing a wide variety of commercial electronic products for electromagnetic compatibility (EMC), electromagnetic interference (EMI), and electrostatic discharge (ESD) under its ISO 17025 accreditation. dBi was founded in Winchester, Kentucky in 1995 by Donald R. Bush, shortly after he retired from 30 years service with IBM Lexington's/ Lexmark's EMC Lab. John R. Barnes, who'd worked with Don at IBM Lexington and Lexmark, bought dBi in 2002 after Don's death, and moved the company to Lexington, Kentucky. John closed dBi at 11:59pm EDT on September 30, 2013, because ObamaCrap had increased operating expenses to the point that we could no longer afford to remain in business.

We'd like to thank all of the clients who chose dBi to test their products from 1995 to 2013. Below is a brief summary of our accomplishments during the 18 years we were in business.

From 1995 to 2001, under Don Bush's ownership and operation, dBi:

Did the official approval testing of 141 products developed by 20 client companies.
Did the official FCC/ Industry Canada (IC) Verification and Declaration of Conformity (DoC) testing of 92 products.
Did the official FCC/IC Certification testing of 15 products.
Did the official CE Marking testing of 100 products.

From 2002 to 2013, under John Barnes' ownership and operation, dBi:

Tested 389 products and 2 testers developed by 44 client companies.
Did the official approval testing of 357 products and 2 testers, getting all but 5 of them to meet all of the FCC, Industry Canada (IC), CE Marking, C-Tick, and Regulatory Compliance Mark (RCM) standards and requirements for their desired market areas.
Did the official FCC/IC Verification and Declaration of Conformity (DoC) testing of 296 products.
Did the official FCC/IC Certification testing of 24 products.
Did the official CE Marking testing of 271 products and 2 testers.
Did the official e-Mark testing of 3 products.
Did the official Australia/New Zealand Verification testing of 170 products.
Co-sponsored John's writing the Robust Electronic Design Reference Book, Volumes I and II.
Served as an expert witness on electronics in three lawsuits.

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Last revised December 3, 2011.

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